Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits /

Bibliographic Details
Main Author:	Bushnell, Michael L. (Michael Lee), 1950-
Other Authors:	Agrawal, Vishwani D., 1943-
Format:	Book
Language:	English
Published:	Boston : Kluwer Academic, [2000]
Series:	Frontiers in electronic testing ; 17.
Subjects:	Integrated circuits > Very large scale integration > Testing. Digital integrated circuits > Testing. Mixed signal circuits > Testing. Semiconductor storage devices > Testing.

Evans: Library Stacks