ITC : International Test Conference 2000 : proceedings : October 3-5, 2000, New Atlantic City Convention Center, Atlantic City, NJ, USA /

Bibliographic Details
Corporate Authors:	International Test Conference Atlantic City, New Jersey, IEEE Computer Society. Test Technology Technical Committee, Institute of Electrical and Electronics Engineers. Philadelphia Section
Format:	Conference Proceeding Book
Language:	English
Published:	Washington, D.C. : Piscataway, New Jersey : International Test Conference ; IEEE, [2000]
Subjects:	Integrated circuits > Testing > Congresses. Electronic digital computers > Circuits > Testing > Congresses. Telecommunication > Congresses. Radio frequency > Congresses.

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