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Microbeam analysis 2000 : proceedings of the Second Conference of the International Union of Microbeam Analysis Societies held in Kailua-Kona, Hawaii, 9-14 July 2000 /

Bibliographic Details
Corporate Author: International Union of Microbeam Analysis Societies. Conference
Other Authors: Williams, David B. (David Bernard), 1949-, Shimizu, R. (Ryūichi), 1937-
Format: Book
Language:English
Published: Bristol ; Philadelphia : Institute of Physics Publishing, [2000]
Series:Institute of Physics conference series ; no. 165.
Subjects:
Electron probe microanalysis > Congresses.
Microprobe analysis > Congresses.
Micrurgy > Congresses.
Spectrum analysis > Congresses.
Description
Physical Description:xxviii, 498 pages : illustrations ; 24 cm.
Bibliography:Includes bibliographical references and index.
ISBN:0750306858