Microbeam analysis 2000 : proceedings of the Second Conference of the International Union of Microbeam Analysis Societies held in Kailua-Kona, Hawaii, 9-14 July 2000 /

Bibliographic Details
Corporate Author:	International Union of Microbeam Analysis Societies. Conference
Other Authors:	Williams, David B. (David Bernard), 1949-, Shimizu, R. (Ryūichi), 1937-
Format:	Book
Language:	English
Published:	Bristol ; Philadelphia : Institute of Physics Publishing, [2000]
Series:	Institute of Physics conference series ; no. 165.
Subjects:	Electron probe microanalysis > Congresses. Microprobe analysis > Congresses. Micrurgy > Congresses. Spectrum analysis > Congresses.

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