Mathematical modeling, estimation, and imaging : 31 July-1 August 2000, San Diego, USA /

Bibliographic Details
Corporate Authors:	Society of Photo-optical Instrumentation Engineers, Society for Industrial and Applied Mathematics
Other Authors:	Wilson, David C., 1942-
Format:	Book
Language:	English
Published:	Bellingham, Wash., USA : SPIE, [2000]
Series:	Proceedings of SPIE--the International Society for Optical Engineering ; v. 4121.
Subjects:	Image processing > Mathematics > Congresses. Image processing > Industrial applications > Congresses. Diagnostic imaging > Mathematics > Congresses. Optical pattern recognition > Mathematical models > Congresses. Computer vision > Congresses.

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