Optical devices and diagnostics in materials science : 1-4 August 2000, San Diego, USA /

Bibliographic Details
Corporate Author:	Society of Photo-optical Instrumentation Engineers
Other Authors:	Andrews, David L., 1952-
Format:	Book
Language:	English
Published:	Bellingham, Wash., USA : SPIE, [2000]
Series:	Proceedings of SPIE--the International Society for Optical Engineering ; v. 4098.
Subjects:	Nanostructured materials > Testing > Congresses. Optical materials > Testing > Congresses. Optoelectronic devices > Congresses. Light > Scattering > Congresses. Near-field microscopy > Industrial applications > Congresses. Raman spectroscopy > Industrial applications > Congresses. Diagnostic imaging > Industrial applications > Congresses.

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