Characterization of high Tc materials and devices by electron microscopy /
| Other Authors: | , |
|---|---|
| Format: | Book |
| Language: | English |
| Published: |
Cambridge ; New York :
Cambridge University Press,
2000.
|
| Subjects: |
Evans: Library Stacks
| Call Number: |
QC611.98.H54 C43 2000 |
|
|---|---|---|
| Call Number | Status | Get It |
| QC611.98.H54 C43 2000 | Available | |