Advances in pattern recognition : joint IAPR International Workshops SSPR 2000 and SPR 2000, Alicante, Spain, August 30-September 1, 2000 : proceedings /

Bibliographic Details
Corporate Authors:	International Workshop on Structural and Syntactic Pattern Recognition Alicante, Spain, International Association for Pattern Recognition, International Workshop on Statistical Techniques in Pattern Recognition
Other Authors:	Ferri, Francesc
Format:	Conference Proceeding Book
Language:	English
Published:	Berlin ; New York : Springer, [2000]
Series:	Lecture notes in computer science ; 1876.
Subjects:	Pattern recognition systems > Congresses.

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