X-ray microscopy : proceedings of the sixth international conference, Berkeley, CA, 2-6 August 1999 /
| Corporate Author: | |
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| Other Authors: | , , |
| Format: | Conference Proceeding Book |
| Language: | English |
| Published: |
Melville, N.Y. :
American Institute of Physics,
[2000]
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| Series: | AIP conference proceedings ;
no. 507. |
| Subjects: |
| Physical Description: | xix, 748 pages : illustrations ; 24 cm. |
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| Bibliography: | Includes bibliographical references and index. |
| ISBN: | 1563969262 |
| ISSN: | 0094-243X ; |