X-ray microscopy : proceedings of the sixth international conference, Berkeley, CA, 2-6 August 1999 /

Bibliographic Details
Corporate Author:	International Conference on X-Ray Microscopy Berkeley, Calif.
Other Authors:	Meyer-Ilse, Werner, 1955-1999, Warwick, Tony, Attwood, David T.
Format:	Conference Proceeding Book
Language:	English
Published:	Melville, N.Y. : American Institute of Physics, [2000]
Series:	AIP conference proceedings ; no. 507.
Subjects:	X-ray microscopy > Congresses.

Remote Storage