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Properties of porous silicon /

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Bibliographic Details
Corporate Author: INSPEC
Other Authors: Canham, Leigh T.
Format: Book
Language:English
Published: London : INSPEC, [1997]
Series:EMIS datareviews series ; no. 18.
Subjects:
Silicon.
Description
Physical Description:xviii, 405 pages : illustrations ; 29 cm.
Bibliography:Includes bibliographies and index.
ISBN:0852969325