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Properties of porous silicon /

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Bibliographic Details
Corporate Author: INSPEC
Other Authors: Canham, Leigh T.
Format: Book
Language:English
Published: London : INSPEC, [1997]
Series:EMIS datareviews series ; no. 18.
Subjects:
Silicon.

Remote Storage

Holdings details from Remote Storage
Call Number: TK7871.15.S55 P76 1997
 
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TK7871.15.S55 P76 1997 Available