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Scanning and force microscopies for biomedical applications II : 23-24 January 2000, San Jose, California /

Bibliographic Details
Corporate Authors: Society of Photo-optical Instrumentation Engineers, International Biomedical Optics Society
Other Authors: Tamiya, Eiichi, Nie, Shuming, Yeung, Edward S.
Format: Book
Language:English
Published: Bellingham, Wash., USA : SPIE, [2000]
Series:Progress in biomedical optics and imaging ; vol. 1, no. 16.
Proceedings of SPIE--the International Society for Optical Engineering ; v. 3922.
Subjects:
Medical electronics > Congresses.
Scanning probe microscopy > Congresses.
Scanning force microscopy > Congresses.
Nanotechnology > Congresses.
Description
Physical Description:ix, 246 pages : illustrations (some color) ; 28 cm.
Bibliography:Includes bibliographical references and index.
ISBN:0819435384