Scanning and force microscopies for biomedical applications II : 23-24 January 2000, San Jose, California /

Bibliographic Details
Corporate Authors:	Society of Photo-optical Instrumentation Engineers, International Biomedical Optics Society
Other Authors:	Tamiya, Eiichi, Nie, Shuming, Yeung, Edward S.
Format:	Book
Language:	English
Published:	Bellingham, Wash., USA : SPIE, [2000]
Series:	Progress in biomedical optics and imaging ; vol. 1, no. 16. Proceedings of SPIE--the International Society for Optical Engineering ; v. 3922.
Subjects:	Medical electronics > Congresses. Scanning probe microscopy > Congresses. Scanning force microscopy > Congresses. Nanotechnology > Congresses.

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