Cover Image

Machine vision applications in industrial inspection VIII : 24-26 January 2000, San Jose, California /

Bibliographic Details
Corporate Authors: IS & T--the Society for Imaging Science and Technology, Society of Photo-optical Instrumentation Engineers
Other Authors: Tobin, Kenneth W.
Format: Book
Language:English
Published: Bellingham, Wash., USA : SPIE, [2000]
Series:Proceedings of SPIE--the International Society for Optical Engineering ; v. 3966.
Subjects:
Engineering inspection > Automation > Congresses.
Computer vision > Industrial applications > Congresses.
Quality control > Optical methods > Automation > Congresses.
Measurement > Congresses.
Description
Physical Description:ix, 396 pages : illustrations ; 28 cm.
Bibliography:Includes bibliographical references and index.
ISBN:0819435848