Machine vision applications in industrial inspection VIII : 24-26 January 2000, San Jose, California /

Bibliographic Details
Corporate Authors:	IS & T--the Society for Imaging Science and Technology, Society of Photo-optical Instrumentation Engineers
Other Authors:	Tobin, Kenneth W.
Format:	Book
Language:	English
Published:	Bellingham, Wash., USA : SPIE, [2000]
Series:	Proceedings of SPIE--the International Society for Optical Engineering ; v. 3966.
Subjects:	Engineering inspection > Automation > Congresses. Computer vision > Industrial applications > Congresses. Quality control > Optical methods > Automation > Congresses. Measurement > Congresses.

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