Laser diodes and LEDs in industrial, measurement, imaging, and sensors applications II : Testing, packaging, and reliability of semiconductor lasers V : 26-25 January, 2000, San Jose, California /
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| Other Authors: | |
| Format: | Book |
| Language: | English |
| Published: |
Bellingham, Washington :
SPIE,
[2000]
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| Series: | Proceedings of SPIE--the International Society for Optical Engineering ;
v. 3945. |
| Subjects: |
| Physical Description: | viii, 320 pages : illustrations ; 28 cm. |
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| Bibliography: | Includes bibliographical references and index. |
| ISBN: | 0819435627 |