Laser diodes and LEDs in industrial, measurement, imaging, and sensors applications II : Testing, packaging, and reliability of semiconductor lasers V : 26-25 January, 2000, San Jose, California /

Bibliographic Details
Corporate Author:	Society of Photo-optical Instrumentation Engineers
Other Authors:	Burnham, Geoffrey T.
Format:	Book
Language:	English
Published:	Bellingham, Washington : SPIE, [2000]
Series:	Proceedings of SPIE--the International Society for Optical Engineering ; v. 3945.
Subjects:	Semiconductor lasers > Testing > Congresses. Semiconductor lasers > Reliability > Congresses. Diodes, Semiconductor > Congresses.

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