Society of Photo-optical Instrumentation Engineers & Burnham, G. T. (2000). Laser diodes and LEDs in industrial, measurement, imaging, and sensors applications II: Testing, packaging, and reliability of semiconductor lasers V : 26-25 January, 2000, San Jose, California. SPIE.
Chicago Style (17th ed.) CitationSociety of Photo-optical Instrumentation Engineers and Geoffrey T. Burnham. Laser Diodes and LEDs in Industrial, Measurement, Imaging, and Sensors Applications II: Testing, Packaging, and Reliability of Semiconductor Lasers V : 26-25 January, 2000, San Jose, California. Bellingham, Washington: SPIE, 2000.
MLA (9th ed.) CitationSociety of Photo-optical Instrumentation Engineers and Geoffrey T. Burnham. Laser Diodes and LEDs in Industrial, Measurement, Imaging, and Sensors Applications II: Testing, Packaging, and Reliability of Semiconductor Lasers V : 26-25 January, 2000, San Jose, California. SPIE, 2000.