Microelectronic failure analysis : desk reference /

Bibliographic Details
Other Authors:	Ross, Richard J., Boit, Christian, Staab, Donald
Format:	Book
Language:	English
Published:	Materials Park, OH : ASM International, [1999]
Edition:	4th ed.
Subjects:	Electronics > Materials > Testing > Handbooks, manuals, etc. Microelectronics > Materials > Testing > Handbooks, manuals, etc. Microelectronics > Materials > Defects > Handbooks, manuals, etc. Electronic apparatus and appliances > Testing > Handbooks, manuals, etc.

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