Scientific detection of fakery in art II : 20-21 September 1999, Boston, Massachusetts /

Bibliographic Details
Corporate Author:	Society of Photo-optical Instrumentation Engineers
Other Authors:	Chartier, Duane R., McCrone, Walter C., Weiss, Richard J. (Richard Jerome), 1923-
Format:	Book
Language:	English
Published:	Bellingham, Wash., USA : SPIE, [2000]
Series:	Proceedings of SPIE--the International Society for Optical Engineering ; v. 3851.
Subjects:	Art > Radiography > Congresses. Art > Forgeries > Congresses. Art > Expertising > Congresses. Painting > Expertising > Congresses. Expertising, X-ray > Congresses. Art and science > Congresses.
Online Access:	https://www.spiedigitallibrary.org/conference-proceedings-of-SPIE/3851.toc

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