Analog and mixed-signal boundary-scan : a guide to the IEEE 1149.4 test standard /
| Other Authors: | Osseiran, Adam |
|---|---|
| Format: | Book |
| Language: | English |
| Published: |
Boston :
Kluwer Academic,
[1999]
|
| Series: | Frontiers in electronic testing ;
16. |
| Subjects: |
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