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Analog and mixed-signal boundary-scan : a guide to the IEEE 1149.4 test standard /

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Bibliographic Details
Other Authors: Osseiran, Adam
Format: Book
Language:English
Published: Boston : Kluwer Academic, [1999]
Series:Frontiers in electronic testing ; 16.
Subjects:
Printed circuits > Testing > Standards.
Boundary scan testing.
Mixed signal circuits > Testing.
Electronic digital computers > Circuits > Design and construction.

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Call Number: TK7868.P7 A53 1999
 
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TK7868.P7 A53 1999 Available