Cover Image

Analog and mixed-signal boundary-scan : a guide to the IEEE 1149.4 test standard /

Show other versions (1)
Bibliographic Details
Other Authors: Osseiran, Adam
Format: Book
Language:English
Published: Boston : Kluwer Academic, [1999]
Series:Frontiers in electronic testing ; 16.
Subjects:
Printed circuits > Testing > Standards.
Boundary scan testing.
Mixed signal circuits > Testing.
Electronic digital computers > Circuits > Design and construction.
Description
Physical Description:xviii, 155 pages : illustrations ; 25 cm.
Bibliography:Includes bibliographical references and index.
ISBN:0792386868