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Impact of electron and scanning probe microscopy on materials research /

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Bibliographic Details
Other Authors: Rickerby, David G., Valdrè, Giovanni, Valdrè, U. (Ugo)
Format: Book
Language:English
Published: Dordrecht ; Boston : Kluwer Academic Publishers, [1999]
Series:NATO ASI series. Applied sciences ; no. 364.
Subjects:
Materials > Microscopy.
Electron microscopy.
Scanning probe microscopy.

Evans: Library Stacks

Holdings details from Evans: Library Stacks
Call Number: TA417.23 .I47 1999
 
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TA417.23 .I47 1999 Available