Optoelectronic metrology : 28-30 September 1998, Łańcut, Poland /
| Corporate Authors: | Institute of Optoelectronics (Wojskowa Akademia Techniczna im. Jarosława Dąbrowskiego), Poland. Central Office of Measures, Foundation for Industrial and Environmental Science (Rzeszów, Poland), Komitet Badań Naukowych (Poland), Society of Photo-optical Instrumentation Engineers, Society of Photo-optical Instrumentation Engineers. Poland Chapter |
|---|---|
| Other Authors: | Owsik, Jan, Więcek, Tomasz |
| Format: | Book |
| Language: | English |
| Published: |
Bellingham, Wash., USA :
SPIE,
[1998]
|
| Series: | SPIE Poland Chapter proceedings ;
52. Proceedings of SPIE--the International Society for Optical Engineering ; v. 4018. |
| Subjects: |
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