Optoelectronic metrology : 28-30 September 1998, Łańcut, Poland /

Bibliographic Details
Corporate Authors:	Institute of Optoelectronics (Wojskowa Akademia Techniczna im. Jarosława Dąbrowskiego), Poland. Central Office of Measures, Foundation for Industrial and Environmental Science (Rzeszów, Poland), Komitet Badań Naukowych (Poland), Society of Photo-optical Instrumentation Engineers, Society of Photo-optical Instrumentation Engineers. Poland Chapter
Other Authors:	Owsik, Jan, Więcek, Tomasz
Format:	Book
Language:	English
Published:	Bellingham, Wash., USA : SPIE, [1998]
Series:	SPIE Poland Chapter proceedings ; 52. Proceedings of SPIE--the International Society for Optical Engineering ; v. 4018.
Subjects:	Optoelectronics > Congresses. Laser beams > Measurement > Congresses. Optical measurements > Congresses.

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