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Optoelectronic metrology : 28-30 September 1998, Łańcut, Poland /

Bibliographic Details
Corporate Authors: Institute of Optoelectronics (Wojskowa Akademia Techniczna im. Jarosława Dąbrowskiego), Poland. Central Office of Measures, Foundation for Industrial and Environmental Science (Rzeszów, Poland), Komitet Badań Naukowych (Poland), Society of Photo-optical Instrumentation Engineers, Society of Photo-optical Instrumentation Engineers. Poland Chapter
Other Authors: Owsik, Jan, Więcek, Tomasz
Format: Book
Language:English
Published: Bellingham, Wash., USA : SPIE, [1998]
Series:SPIE Poland Chapter proceedings ; 52.
Proceedings of SPIE--the International Society for Optical Engineering ; v. 4018.
Subjects:
Optoelectronics > Congresses.
Laser beams > Measurement > Congresses.
Optical measurements > Congresses.
Description
Physical Description:xiv, 152 pages : illustrations ; 28 cm.
Bibliography:Includes bibliographical references and index.
ISBN:0819436445