Society of Photo-optical Instrumentation Engineers, Fineschi, S., Woodgate, B., & Kimble, R. A. (1999). Ultraviolet and X-ray detection, spectroscopy, and polarimetry III: 19-20 July 1999, Denver, Colorado. SPIE.
Chicago Style (17th ed.) CitationSociety of Photo-optical Instrumentation Engineers, Silvano Fineschi, Bruce Woodgate, and Randy A. Kimble. Ultraviolet and X-ray Detection, Spectroscopy, and Polarimetry III: 19-20 July 1999, Denver, Colorado. Bellingham, Wash., USA: SPIE, 1999.
MLA (9th ed.) CitationSociety of Photo-optical Instrumentation Engineers, et al. Ultraviolet and X-ray Detection, Spectroscopy, and Polarimetry III: 19-20 July 1999, Denver, Colorado. SPIE, 1999.
Warning: These citations may not always be 100% accurate.