Ultraviolet and X-ray detection, spectroscopy, and polarimetry III : 19-20 July 1999, Denver, Colorado /

Bibliographic Details
Corporate Author:	Society of Photo-optical Instrumentation Engineers
Other Authors:	Fineschi, Silvano, Woodgate, Bruce, Kimble, Randy A. (Randy Alan)
Format:	Book
Language:	English
Published:	Bellingham, Wash., USA : SPIE, [1999]
Series:	Proceedings of SPIE--the International Society for Optical Engineering ; v. 3764.
Subjects:	Polarimetry > Congresses. X-ray astronomy > Instruments > Congresses. Ultraviolet astronomy > Instruments > Congresses. Ultraviolet detectors > Congresses.
Online Access:	https://www.spiedigitallibrary.org/conference-proceedings-of-SPIE/3764.toc

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