Single event effect characterization of new technology integrated circuits /

This dissertation evaluates the parallel trends towards increased device susceptibility to Single Event Effects (SEE) and toward the application of commercial new technology semiconductor devices to space systems as well as airborne avionics. This effort is directed toward testing and analysis of co...

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Bibliographic Details

Main Author:	You, Zhong
Format:	Thesis Book
Language:	English
Published:	[Place of publication not identified] : [publisher not identified] ; 1998.
Subjects:	Major electrical engineering.
Online Access:	http://proxy.library.tamu.edu/login?url=http://proquest.umi.com/pqdweb?did=733048841&sid=1&Fmt=2&clientId=2945&RQT=309&VName=PQD