Interconnect testing of embedded memories at chip and system level /

Interconnect testing has become an important aspect for a comprehensive testing of digital system once they are assembled at board/chip level; this has been pioneered by the IEEE through the standard on boundary scan architecture and test access port and its widespread application by the electronic...

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Bibliographic Details

Main Author:	Zhao, Jun
Format:	Thesis Book
Language:	English
Published:	[Place of publication not identified] : [publisher not identified] ; 1999.
Subjects:	Major computer science.
Online Access:	http://proxy.library.tamu.edu/login?url=http://proquest.umi.com/pqdweb?did=733676321&sid=1&Fmt=2&clientId=2945&RQT=309&VName=PQD