Dependability analysis of memory subsystems /

This research presents the simulation-assisted radiation-testing environment wherein the dependability analysis of memory subsystems using simulation and radiation experiment can be conducted. A recent system-design trend requires a high memory bandwidth to support the high-performance processor and...

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Bibliographic Details

Main Author:	Hwang, Seunghwe
Format:	Thesis Book
Language:	English
Published:	[Place of publication not identified] : [publisher not identified] ; 1999.
Subjects:	Major computer engineering.
Online Access:	http://proxy.library.tamu.edu/login?url=http://proquest.umi.com/pqdweb?did=733675681&sid=1&Fmt=2&clientId=2945&RQT=309&VName=PQD