Cover Image

ITC : International Test Conference 1999 proceedings : September 28-30, 1999, New Atlantic City Convention Center, Atlantic City, NJ, USA /

Bibliographic Details
Corporate Authors: International Test Conference Atlantic City, N. J., IEEE Computer Society, Institute of Electrical and Electronics Engineers. Philadelphia Section
Format: Conference Proceeding Book
Language:English
Published: Washington, D.C. : Piscataway New Jersey : International Test Conference ; IEEE, [1999]
Subjects:
Integrated circuits > Testing > Congresses.
Electronic digital computers > Circuits > Testing > Congresses.
Telecommunication > Congresses.
Radio frequency > Congresses.
Description
Item Description:"IEEE catalog number 99CH37034"--Title page verso.
Physical Description:xiv, 1163 pages : illustrations ; 29 cm.
Bibliography:Includes bibliographical references and index.
ISBN:0780357531 (softbound)
078035754X (casebound)
0780357558 (microfiche)