ITC : International Test Conference 1999 proceedings : September 28-30, 1999, New Atlantic City Convention Center, Atlantic City, NJ, USA /

Bibliographic Details
Corporate Authors:	International Test Conference Atlantic City, N. J., IEEE Computer Society, Institute of Electrical and Electronics Engineers. Philadelphia Section
Format:	Conference Proceeding Book
Language:	English
Published:	Washington, D.C. : Piscataway New Jersey : International Test Conference ; IEEE, [1999]
Subjects:	Integrated circuits > Testing > Congresses. Electronic digital computers > Circuits > Testing > Congresses. Telecommunication > Congresses. Radio frequency > Congresses.

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