Rough surface scattering and contamination : 21-23 July 1999, Denver, Colorado /

Bibliographic Details
Corporate Author:	Society of Photo-optical Instrumentation Engineers
Other Authors:	Chen, Philip T., Gu, Zu-Han, Maradudin, Alexei A., 1931-
Format:	Book
Language:	English
Published:	Bellingham, Wash. : SPIE, [1999]
Series:	Proceedings of SPIE--the International Society for Optical Engineering ; v. 3784.
Subjects:	Surface roughness > Measurement > Congresses. Light > Scattering > Congresses. Surface contamination > Congresses. Space vehicles > Contamination > Congresses.

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