Cover Image

Machine vision systems for inspection and metrology VIII : 21-22 September 1999, Massachusetts /

Bibliographic Details
Corporate Authors: Society of Photo-optical Instrumentation Engineers, Machine Vision Association of SME
Other Authors: Miller, John W. V., Solomon, Susan Snell, Batchelor, Bruce G.
Format: Book
Language:English
Published: Bellingham, Washington : SPIE, [1999]
Series:Proceedings of SPIE--the International Society for Optical Engineering ; v. 3836.
Subjects:
Computer vision > Congresses.
Engineering inspection > Automation > Congresses.
Optical measurements > Congresses.
Computer vision > Industrial applications > Congresses.
Description
Physical Description:vii, 252 pages : illustrations ; 28 cm.
Bibliography:Includes bibliographical references and index.
ISBN:0819434299