Machine vision systems for inspection and metrology VIII : 21-22 September 1999, Massachusetts /

Bibliographic Details
Corporate Authors:	Society of Photo-optical Instrumentation Engineers, Machine Vision Association of SME
Other Authors:	Miller, John W. V., Solomon, Susan Snell, Batchelor, Bruce G.
Format:	Book
Language:	English
Published:	Bellingham, Washington : SPIE, [1999]
Series:	Proceedings of SPIE--the International Society for Optical Engineering ; v. 3836.
Subjects:	Computer vision > Congresses. Engineering inspection > Automation > Congresses. Optical measurements > Congresses. Computer vision > Industrial applications > Congresses.

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