Cover Image

Developments in x-ray tomography II : 22-23 July 1999, Denver, Colorado /

Bibliographic Details
Corporate Author: Society of Photo-optical Instrumentation Engineers
Other Authors: Bonse, U.
Format: Book
Language:English
Published: Bellingham, Washington : SPIE, [1999]
Series:Proceedings of SPIE--the International Society for Optical Engineering ; v. 3772.
Subjects:
Tomography > Congresses.
X-rays > Congresses.
Diagnostic imaging > Congresses.

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