Developments in x-ray tomography II : 22-23 July 1999, Denver, Colorado /

Bibliographic Details
Corporate Author:	Society of Photo-optical Instrumentation Engineers
Other Authors:	Bonse, U.
Format:	Book
Language:	English
Published:	Bellingham, Washington : SPIE, [1999]
Series:	Proceedings of SPIE--the International Society for Optical Engineering ; v. 3772.
Subjects:	Tomography > Congresses. X-rays > Congresses. Diagnostic imaging > Congresses.

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