Cover Image

Developments in x-ray tomography II : 22-23 July 1999, Denver, Colorado /

Bibliographic Details
Corporate Author: Society of Photo-optical Instrumentation Engineers
Other Authors: Bonse, U.
Format: Book
Language:English
Published: Bellingham, Washington : SPIE, [1999]
Series:Proceedings of SPIE--the International Society for Optical Engineering ; v. 3772.
Subjects:
Tomography > Congresses.
X-rays > Congresses.
Diagnostic imaging > Congresses.
Description
Physical Description:ix, 340 pages : illustrations (some color) ; 28 cm.
Bibliography:Includes bibliographical references and index.
ISBN:081943258X