Cover Image

Introduction to semiconductor device yield modeling /

Bibliographic Details
Main Author: Ferris-Prabhu, Albert V.
Format: Book
Language:English
Published: Boston : Artech House, [1992]
Series:Artech House materials science library.
Subjects:
Semiconductors > Defects.
Semiconductor industry > Quality control.

Remote Storage

Holdings details from Remote Storage
Call Number: TK7871.85 .F46 1992
 
Call Number Status Get It
TK7871.85 .F46 1992 Available