Process control and sensors for manufacturing II : 3-4 March 1999, Newport Beach, California /

Bibliographic Details
Corporate Authors:	Society of Photo-optical Instrumentation Engineers, Society for Experimental Mechanics (U.S.), American Society for Nondestructive Testing, Nihon Hi Hakai Kensa Kyōkai
Other Authors:	Pepper, David M.
Format:	Book
Language:	English
Published:	Bellingham, Wash., USA : SPIE, [1999]
Series:	Proceedings of SPIE--the International Society for Optical Engineering ; v. 3589.
Subjects:	Process control > Automation > Congresses. Detectors > Industrial applications > Congresses. Quality control > Congresses.

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