Improving the accuracy of SRAM-based failure analysis using IDDQ testing /

accuracy of SRAM-based defect diagnosis using

Bibliographic Details

Main Author:	Nugroho, Setyo, 1970-
Format:	Thesis eBook
Language:	English
Published:	[Place of publication not identified] : [publisher not identified] ; 1998.
Subjects:	Major electrical engineering.
Online Access:	Link to OAKTrust copy