Cover Image

Materials reliability in microelectronics VIII : symposium held April 13-16, 1998, San Francisco, California, U.S.A. /

Bibliographic Details
Other Authors: Bravman, J. C. (John C.)
Format: Book
Language:English
Published: Warrendale, Pennsylvania : Materials Research Society, [1998]
Series:Materials Research Society symposia proceedings ; v. 516.
Subjects:
Microelectronics > Reliability > Congresses.
Microelectronics > Materials > Testing > Congresses.
Microstructure > Congresses.
Metallizing > Congresses.
Description
Physical Description:xi, 365 pages : illustrations ; 24 cm.
Bibliography:Includes bibliographical references and indexes.
ISBN:155899422X