Materials reliability in microelectronics VIII : symposium held April 13-16, 1998, San Francisco, California, U.S.A. /

Bibliographic Details
Other Authors:	Bravman, J. C. (John C.)
Format:	Book
Language:	English
Published:	Warrendale, Pennsylvania : Materials Research Society, [1998]
Series:	Materials Research Society symposia proceedings ; v. 516.
Subjects:	Microelectronics > Reliability > Congresses. Microelectronics > Materials > Testing > Congresses. Microstructure > Congresses. Metallizing > Congresses.

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