An Investigation of Defect Detection using Random Defect Excitation and Deterministic Defect Observation in Complex Integrated Logic Circuits.

aWhenever integrated circuits are manufactured, a certain percentage of those circuits will be defective. Defective circuits present problems for both the manufacturers who wish to maintain a good reputation with their customers and the consumers who depend upon the correct operation of the product...

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Bibliographic Details

Main Author:	Dworak, Jennifer
Corporate Author:	Texas A & M University. University Undergraduate Research Fellows Program
Format:	Thesis Book
Language:	English
Published:	[College Station, Texas] : Texas A&M University, 1998.
Subjects:	Major engineering I. automatic test pattern generation Undergraduate thesis
Online Access:	Link to OAK Trust copy Available on OAKTrust.