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Delay fault testing for VLSI circuits /

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Bibliographic Details
Main Author: Krstić, Angela, 1965-
Other Authors: Cheng, Kwang-Ting, 1961-
Format: Book
Language:English
Published: Boston : Kluwer Academic Publishers, [1998]
Series:Frontiers in electronic testing.
Subjects:
Integrated circuits > Very large scale integration > Testing.
Delay faults (Semiconductors)
Description
Physical Description:xii, 191 pages : illustrations ; 24 cm.
Bibliography:Includes bibliographical references (pages [173]-188) and index.
ISBN:0792382951 (alk. paper)