Delay fault testing for VLSI circuits /

Bibliographic Details
Main Author:	Krstić, Angela, 1965-
Other Authors:	Cheng, Kwang-Ting, 1961-
Format:	Book
Language:	English
Published:	Boston : Kluwer Academic Publishers, [1998]
Series:	Frontiers in electronic testing.
Subjects:	Integrated circuits > Very large scale integration > Testing. Delay faults (Semiconductors)

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