Cover Image

Machine vision systems for inspection and metrology VII : 4-5 November, 1998, Boston, Massachusetts /

Bibliographic Details
Corporate Authors: Society of Photo-optical Instrumentation Engineers, Machine Vision Association of SME
Other Authors: Batchelor, Bruce G., Miller, John W. V., Solomon, Susan Snell
Format: Book
Language:English
Published: Bellingham, Wash. : SPIE, [1998]
Series:Proceedings of SPIE--the International Society for Optical Engineering ; v. 3521.
Subjects:
Computer vision > Congresses.
Engineering inspection > Automation > Congresses.
Optical measurements > Congresses.
Computer vision > Industrial applications > Congresses.
Description
Physical Description:xi, 386 pages : illustrations ; 28 cm.
Bibliography:Includes bibliographical references and index.
ISBN:0819429821